By Leendert M. Huisman
There are many strategies for examining IC fails, yet they're scattered over the pro IC try and prognosis literature, and in numerous statistics and information mining handbooks. furthermore, many information mining options which are regular in different information research environments, and which are acceptable for examining IC fails, haven't but been hired for that function.
Data Mining and Diagnosing IC Fails addresses the matter of acquiring greatest info from (functional) built-in circuit fail information in regards to the defects that triggered the fails. It begins on the maximum point from mere kind codes, and drills down through a number of info mining concepts to certain good judgment prognosis. many of the ways mentioned during this ebook have an intensive theoretical underpinning, yet are geared in the direction of functions on actual existence fail facts and cutting-edge ICs. This booklet brings jointly quite a few research suggestions which are appropriate for IC fail information, yet that aren't to be had somewhere else in one position. numerous of the suggestions, in truth, were provided just recently in technical meetings.
The goal of the ebook is to compile in a single position a lot of research, facts mining and prognosis concepts that experience confirmed to be precious in interpreting IC fails. The descriptions of the concepts and research exercises is adequately special that pro production engineers can enforce them of their personal paintings environment.
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Extra resources for Data mining and diagnosing IC fails
17, as long as the peak value of v a , V ma , is less than the break-point voltage in the amplifier characteristic, δ , the gain at the fundamental frequency is m 1 > 3 and, therefore, the system operates in such a way that keeps oscillations growing. But this effect is counteracted when V ma exceeds its limit value, δ , and the amplifier goes in the m 2 region. Then, provided that the selected value of m 2 is under 3, the amplitude of oscillations tends to diminish until the effective gain is reduced to 3.
The OBT approach, as introduced therein, requires to convert the System Under Test (SUT) in an oscillator structure by incorporating a nonlinear feedback loop. The requirement of this nonlinear block makes the study of such an oscillator very complex. Therefore, we are very interested in finding a practical model which can be straightforwardly used to design such an oscillator. A possible solution would consist in employing the Describing-Function (DF) approach , -, . It is a simple and widely used method, easy to handle, intuitive, although restricted to systems fulfilling some conditions.
But this effect is counteracted when V ma exceeds its limit value, δ , and the amplifier goes in the m 2 region. Then, provided that the selected value of m 2 is under 3, the amplitude of oscillations tends to diminish until the effective gain is reduced to 3. 18 V ma ---------δ Chapter 1: Oscillation-Based Test Methodology 31 Notice from Fig. 17, that depending on the exact value of gain m 2 , for each value of m 1 , equilibrium establishes at a different point. But, certainly, the higher m 2 , the smaller the distortion in the output (see Fig.
Data mining and diagnosing IC fails by Leendert M. Huisman